skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

Explore Research Products in the PAR
It may take a few hours for recently added research products to appear in PAR search results.


  • Home
  • Search Results
  • Page 1 of 1

Search for: All records

Creators/Authors contains: "Kralk, Samo"

Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher. Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?

Some links on this page may take you to non-federal websites. Their policies may differ from this site.

  1. ; ; (, Soft matter)
    Nematic cells patterned with square arrays of strength m = ±1 topological defects were examined as a function of cell thickness (3 < h < 7.5 μm), temperature, and applied voltage. Thicker cells tend to exhibit an escape or partial escape of the nematic director as a means of mitigating the elastic energy cost near the defect cores, whereas thinner cells tend to favor splitting of the integer defects into pairs of half-integer strength defects. On heating the sample into the isotropic phase and cooling back into the nematic, some apparently split defects can reappear as unsplit integer defects, or vice versa. This is consistent with the system’s symmetry, which requires a first order transition between the two relaxation mechanisms. 
    more » « less
    Accepted Manuscript Full Text Available